Chroma/致茂臺灣58173lr Model
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產品詳情
“Chroma/致茂臺灣58173lr Model”參數說明
| 型號： | 58173-TC | 規格： | 58173-TC |
| 商標： | 58173-TC | 包裝： | 58173-TC |
“Chroma/致茂臺灣58173lr Model”詳細介紹
Chroma/致茂臺灣58173-TCLED Chip Level Tester Model特色：
- High test speed: complete whole test within 25ms (selected test items)
- Super statble of temperature variation
- Support high voltage and high power LED test requirement
- Support multi-die test (option)
- Support ESD test (option)
The LED Test System Model 58173-TC focuses on LED wafer/ current output measurement, optical power measurement,, several electrical and optical characteristics analysis can be achieved at a time within 25 ms, and its electrical measurement supports high-voltage LED and highbrightness LED applications.
On system integration,, optional switch module allows test system to perform multi-channel and multi-chip measurements.
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