Chroma/致茂臺灣58212-CTester Mode特色：

• High speed and accuracy
• Lateral, vertical, and flip chip
• Wide power test range (up to 200V/2A)
• Up to 8 inch wafers
• Chroma® Huge Photo Detector
• Unique edge sensor
• Patented probe head
• Robust Z-Axis stage
• Wafer mapping algorithm
• External light shielding enclosure
• Analysis tools and statistical reports

Test Items

• Electrical parameters: 
  - Forward Voltage Measurement (Vf ) 
  - Reverse Breakdown Voltage Measurement (Vrb) 
  - Reverse Leakage Current (Ir) 
  - SCR detection
• Optical parameters: 
  - Optical power (mw, lm, mcd) 
  - Dominant Wavelength (Wd) 
  - Peak Wavelength (Wp) 
  - Full Width at Half Maximum (FWHM) 
  - CIExy - CCT - CRI
• 
   

The Chroma 58212-C features an automated LED wafer/chip probe tester, delivering fast and accurate LED measurements with test times less than 125ms *1.

The system can be modified to support different LED structures including Lateral, Vertical,.

Chroma's unique design acquires and analyzes optical data such as the dominant wave length, peak wavelength,, it provides essential electrical data such as forward voltage, leakage current, and rever reakdown voltage, all in one test step.

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Note *1 : Test condition: under 300um sample pitch,, the measurement results may vary.

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ModelDescription詢價58212-CLED Mapping Probe Tester